Publications

Export 1 results:
Author Title Type [ Year(Desc)]
Filters: Keyword is dual-port reflectometry technique and Author is Jehl, X.  [Clear All Filters]
2015
Orlov A.O., Fay P., Snider G.L., Jehl X., Barraud S., Sanquer M..  2015.  Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. Nanotechnology Magazine, IEEE. 9:24-32.