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Filters: Keyword is radiofrequency reflectometry and Author is Sanquer, M.  [Clear All Filters]
2015
Orlov A.O., Fay P., Snider G.L., Jehl X., Barraud S., Sanquer M..  2015.  Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. Nanotechnology Magazine, IEEE. 9:24-32.