Publications

Export 1 results:
Author [ Title(Desc)] Type Year
Filters: Keyword is Nanoscale devices and Author is Sanquer, M.  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
D
Orlov A.O., Fay P., Snider G.L., Jehl X., Barraud S., Sanquer M..  2015.  Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. Nanotechnology Magazine, IEEE. 9:24-32.