Publications

Export 1 results:
Author Title [ Type(Desc)] Year
Filters: Keyword is Radio frequency and Author is Jehl, X.  [Clear All Filters]
Journal Article
Orlov A.O., Fay P., Snider G.L., Jehl X., Barraud S., Sanquer M..  2015.  Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. Nanotechnology Magazine, IEEE. 9:24-32.