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Orlov A.O., Fay P., Snider G.L., Jehl X., Barraud S., Sanquer M..  2015.  Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. Nanotechnology Magazine, IEEE. 9:24-32.
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Sjalander M., Nilsson N.S., Kaxiras S..  2014.  A tunable cache for approximate computing. Nanoscale Architectures (NANOARCH), 2014 IEEE/ACM International Symposium on.