Publications

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Journal Article
Orlov A.O., Fay P., Snider G.L., Jehl X., Barraud S., Sanquer M..  2015.  Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors.. Nanotechnology Magazine, IEEE. 9:24-32.
Clapera P., Ray S., Jehl X., Sanquer M., Valentian A., Barraud S..  2015.  Design and Cryogenic Operation of a Hybrid Quantum-CMOS Circuit. Phys. Rev. Applied. 4:044009.