Submitted by francesco.orfei on
| Title | Dual-Port Reflectometry Technique: Charge identification in nanoscaled single-electron transistors. |
| Publication Type | Journal Article |
| Year of Publication | 2015 |
| Authors | Orlov A.O., Fay P., Snider G.L., Jehl X., Barraud S., Sanquer M. |
| Journal | Nanotechnology Magazine, IEEE |
| Volume | 9 |
| Pagination | 24-32 |
| Date Published | June |
| ISSN | 1932-4510 |
| Keywords | blood, cable, Capacitance, charge identification, dielectric property measurement, Distance measurement, dual-port reflectometry technique, electric charge, Electric potential, electronic nanostructure characterization, impedance matching, Logic gates, microwave radiofrequency signal, microwave reflectometry, microwave resonators, microwave RF signal, Nanoscale devices, nanoscaled single-electron transistor, Power cables, Radio frequency, radiofrequency reflectometry, resonator, RFR technique, single electron transistors, soil moisture detector, specimen parameter modification, Spectroscopy, transmission line, wire |
| DOI | 10.1109/MNANO.2015.2409411 |
ICT-Energy group
